The VK-X200 3D Laser Scanning Microscope from KEYENCE Corporation is the latest system being utilized for advanced non-contact 3D surface characterization and roughness measurements. Combining the capabilities of a roughness gauge, scanning electron microscope and optical microscope, the VK-X Series is able to perform profile, roughness and thickness measurements with 0.5 nm z-resolution on nearly any material. By rastering a laser across a target, this microscope captures fully-focused 2D images and acquires 3D data on surfaces with angles approaching 90 degrees – well beyond the detection capabilities of a white light interferometer. A newly-designed automation function allows users to scan and measure a target with the touch of a button, dramatically reducing the time required to analyze an object and eliminating measurement variations between different users.